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Articles 1–20. Chargé de recherche, CEMES-CNRS - Cited by 3,111 - transmission electron microscopy - strain - ion implantation - defects - precipitation.
Mar 16, 2023 · "The Kremlin geriatrics in the Politburo with Brezhnev at the head were never going to lead the country to prosperity," Russian naval historian Nikolai Cherkashin said in a documentary.
Jan 3, 1994 · “As in ancient Assyria, where a ship’s path to the water was slickened with the sacrificial blood of slaves, the launching ramp of the K-19 ran with human blood,” wrote Nikolai Cherkashin, a...
Oct 3, 2022 · The story appears to have originated as a work of fiction by a Ukrainian writer by the name of Nikolai Cherkashin, who is cited by the E-Borghi blogger as having done research and gathered...
Nikolay Cherkashin, Shay Reboh, Martin Hÿtch, Alain Claverie, V.V. Preobrazhenskii Applied Physics Letters , 2013, 102 (17), pp.173115. 10.1063/1.4804380
Nikolay Cherkashin. Follow. Research Interests: none. Papers. Detailed characterisation of focused ion beam induced lateral damage on silicon carbide samples by electrical scanning probe microscopy and transmission electron microscopy. by Nikolay Cherkashin. Publisher: AIP Publishing. Publication Date: 2018.
Publication Topics Ionizing Radiation,Silicon,Stress Field,Active Region,Annealed Samples,Burgers Vector,Carrier Mobility,Center Of The Sample,Compressive Stress ...
